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1

[IEEE 2017 IEEE 35th International Conference on Computer Design (ICCD) - Boston, MA, USA (2017.11.5-2017.11.8)] 2017 IEEE International Conference on Computer Design (ICCD) - BioChipWork: Reverse Engineering of Microfluidic Biochips

Chen, Huili, Potluri, Seetal, Koushanfar, Farinaz

Year:

2017

Language:

english

File:

PDF, 1.37 MB

english, 2017

2

[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Cell-Aware ATPG to Improve Defect Coverage for FPGA IPs and Next Generation Zynq® MPSoCs

Potluri, Seetal, Mathew, Aaron, Nerukonda, Rambabu, Hartanto, Ismed, Toutounchi, Shahin

Year:

2017

Language:

english

File:

PDF, 561 KB

english, 2017

3

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Efficacy of Satisfiability-Based Attacks in the Presence of Circuit Reverse-Engineering Errors

Tan, Qinhan, Potluri, Seetal, Aysu, Aydin

Year:

2020

File:

PDF, 384 KB

2020

4

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information

Potluri, Seetal, Trinadh, Satya, Baskaran, Roopashree, Chandrachoodan, Nitin, Kamakoti, V.

Year:

2013

Language:

english

File:

PDF, 163 KB

english, 2013

5

[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - LPScan: An algorithm for supply scaling and switching activity minimization during test

Potluri, Seetal, Adireddy, Satya Trinadh, Rajamanikkam, Chidhambaranathan, Balachandran, Shankar

Year:

2013

Language:

english

File:

PDF, 277 KB

english, 2013

6

[IEEE 2011 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Chennai, India (2011.07.4-2011.07.6)] 2011 IEEE Computer Society Annual Symposium on VLSI - Post-Synthesis Circuit Techniques for Runtime Leakage Reduction

Potluri, Seetal, Chandrachoodan, Nitin, Kamakoti, V.

Year:

2011

Language:

english

File:

PDF, 224 KB

english, 2011

7

DFT Assisted Techniques for Peak Launch-to-Capture Power Reduction during Launch-On-Shift At-Speed Testing

Potluri, Seetal, Trinadh, A. Satya, Ch., Sobhan Babu, Kamakoti, V., Chandrachoodan, Nitin

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

8

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - Component fault localization using switching current measurements

Potluri, Seetal, Trinadh, A. Satya, Saraf, Siddhant, Veezhinathan, Kamakoti

Year:

2016

Language:

english

File:

PDF, 292 KB

english, 2016

9

[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Synthesis of on-chip control circuits for mVLSI biochips

Potluri, Seetal, Schneider, Alexander, Horslev-Petersen, Martin, Pop, Paul, Madsen, Jan

Year:

2017

Language:

english

File:

PDF, 960 KB

english, 2017

10

[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - A scalable pseudo-exhaustive search for fault diagnosis in microfluidic biochips

Gokulkrishnan, V, Kamakoti, V, Chandrachoodan, Nitin, Potluri, Seetal

Year:

2017

Language:

english

File:

PDF, 168 KB

english, 2017

11

Design-For-Testability of On-Chip Control in mVLSI Biochips

Potluri, Seetal, Pop, Paul, Madsen, Jan

Journal:

IEEE Design and Test

Year:

2018

Language:

english

File:

PDF, 286 KB

english, 2018

12

Scalable pseudo-exhaustive methodology for testing and diagnosis in flow-based microfluidic biochips

Vadakkeveedu, Gokulkrishnan, Veezhinathan, Kamakoti, Chandrachoodan, Nitin, Potluri, Seetal

Journal:

IET Computers & Digital Techniques

Year:

2020

File:

PDF, 1.66 MB

2020

13

[IEEE 2020 21st International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2020.3.25-2020.3.26)] 2020 21st International Symposium on Quality Electronic Design (ISQED) - SeqL: Secure Scan-Locking for IP Protection

Potluri, Seetal, Aysu, Aydin, Kumar, Akash

Year:

2020

File:

PDF, 281 KB

2020

14

[IEEE 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - MontrÃ©al, QC, Canada (2020.6.16-2020.6.19)] 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - FlowTrojan: Insertion and Detection of Hardware Trojans on Flow-Based Microfluidic Biochips

Chen, Huili, Potluri, Seetal, Koushanfar, Farinaz

Year:

2020

File:

PDF, 1.53 MB

2020